2016
DOI: 10.1016/j.jcrysgro.2016.05.050
|View full text |Cite
|
Sign up to set email alerts
|

Thickness modulation and strain relaxation in strain-compensated InGaP/InGaP multiple-quantum-well structure grown by metalorganic molecular beam epitaxy on GaAs (100) substrate

Abstract: We have investigated the structural features of a strain-compensated InGaP/InGaP multiple-quantum-well (MQW) structure on GaAs (100) substrate with a band-gap energy of around 1.7 eV for solar cell applications. In transmission electron microscopy images, noticeable thickness modulation was observed in the barrier layers for a sample grown at the

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2017
2017
2017
2017

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 29 publications
0
0
0
Order By: Relevance