Thickness variations in extraordinary and spontaneous Hall coefficients of iron films

Pichard, C. R.; Tellier, C. R.; Tosser, A. J.; Vautier, C.

doi:10.1051/rphysap:019800015080130300

Cited by 10 publications

(1 citation statement)

References 34 publications

(45 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Following the previous discussion, that would mean that the side jump is the dominant mechanism of the extraordinary Hall effect. Coren and Juretschke, 23 Pichard et al, 24 and Schad et al 25 have drawn this conclusion from similar experimental results on thin Ni and Fe films. However, the high-resistivity ͑thin͒ samples deviate strongly from the linear variation and do not support this scenario.…”

Section: Resultsmentioning

confidence: 72%

Effect of surface scattering on the extraordinary Hall coefficient in ferromagnetic films

et al. 2002

View full text Add to dashboard Cite

The effect of surface scattering on the extraordinary Hall coefficient has been studied in thin films of nickel and granular Ni-SiO 2 mixtures. The surface scattering contributions to the Hall coefficient and longitudinal resistivity have been extracted from the respective total values. The temperature-independent linear relation between the two parameters has been found. Different scattering mechanisms need to be separated, and the applicability of the existing models for heterogeneous systems with spatially extended scattering centers should be reexamined.

show abstract

Section: Resultsmentioning

confidence: 72%

Effect of surface scattering on the extraordinary Hall coefficient in ferromagnetic films

et al. 2002

View full text Add to dashboard Cite

show abstract

The Hall Effect in MnSe Films

Angadi

Thanigaimani

1993

Phys. Stat. Sol. (a)

View full text Add to dashboard Cite

The Hall Effect in MnSe Films B Y M. A. ANGADI and V. THANIGAIMANIThe Hall effect is rcported for MnSe films of different compositions and thickness in the range 30 to 150 nm. Both Ro and R, are dependent on thickness, composition, and substrate temperature. R, and R, cxhibit both positive and negative values for different thickness ranges studied. The extraordinary Hall coefficient is proportional to the square of the total film resistivity for higher thicknesses ( > 100 nm).') St. Augustine, Trinidad & Tobago, West Indies.

show abstract