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The temperature dependence of sheet resistance, the size effect of the temperature coefficient of resistance (TCR), and the Neel temperature for films in the thickness range 25 to 180 nm are reported. A computer based technique is used within the framework of the Mayadas-Shatzkes (MS) model to calculate the parameters p , R, 1, and b0. The experimental data are in good agreement with the MS model over the entire thickness range. The Neel temperature and TCR are dependent on the substrate temperature, composition, and film thickness.

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