2005
DOI: 10.1007/0-387-23319-9_10
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Thin Film Piezoelectrics for MEMS

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Cited by 103 publications
(146 citation statements)
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“…where D i is the dielectric displacement and d im is a matrix of the the piezoelectric strain coefficients [40,62,69]. Typical values for these parameters are given in Table 2.1.…”
Section: Piezoelectric Sensorsmentioning
confidence: 99%
“…where D i is the dielectric displacement and d im is a matrix of the the piezoelectric strain coefficients [40,62,69]. Typical values for these parameters are given in Table 2.1.…”
Section: Piezoelectric Sensorsmentioning
confidence: 99%
“…This shows that the PZT-Ge composite has low attenuation and high phase velocity, which indicates that the wave signal can travel longer distances in this structure. This is attributed to the fact that the characteristics of the composites consisting of thin-layered structures are dominated by the layer properties Trolier-Mckinstry and Muralt 2004]. Moreover, the generalised Rayleigh surface waves usually follow the interface surface as their guiding surface by causing less disturbance to the core material than in the patch.…”
Section: Numerical Results and Discussionmentioning
confidence: 99%
“…The only accelerometer with piezoelectric thick film (>5 μm thick) has been presented by Beeby et al [4]. Piezo electric thin film in MEMS has been studied intensively [5]. However for high bandwidth applications accelerometers with piezoelectric thick films result in significant higher voltage sensitivity for a given bandwidth.…”
Section: Introductionmentioning
confidence: 99%