“…In practice, atomic resolution STEM imaging of core/shell structures is only possible when the shell is a crystalline material, as the presence of an amorphous shell deteriorates the quality of the signal from the crystalline core. Examples of electron microscopy characterisation of semiconductor nanocrystals have included determination of their shape and size (McBride et al, 2004;Sahu et al, 2012;Bals et al, 2011;Ruberu and Vela, 2011), crystal structure (Soriano et al, 2012), examination of shell coverage (Yu et al, 2005;McBride et al, 2006) and chemical composition (Gunawan et al, 2011;McBride et al, 2006;Abel et al, 2012). Nonetheless, the number of high resolution electron microscopy studies of semiconductor nanocrystals is relatively sparse.…”