Three-dimensional microstructural imaging methods for energy materials

Abstract

Advances in the design of materials for energy storage and conversion (i.e., "energy materials") increasingly rely on understanding the dependence of a material's performance and longevity on three-dimensional characteristics of its microstructure. Three-dimensional imaging techniques permit the direct measurement of microstructural properties that significantly influence material function and durability, such as interface area, tortuosity, triple phase boundary length and local curvature. Furthermore, digital representations of imaged microstructures offer realistic domains for modeling. This article reviews state-of-the-art methods, across a spectrum of length scales ranging from atomic to micron, for three-dimensional microstructural imaging of energy materials. The review concludes with an assessment of the continuing role of three-dimensional imaging in the development of novel materials for energy applications.

An Interdisciplinary View of Interfaces: Perspectives Regarding Emergent Phase Formation

“…Various imaging techniques are available for this effort, including focused ion beam-scanning electron microscopy, transmission X-ray microscopy, atom probe tomography with a wide range of spatial resolution and field of view as summarized in recent reviews [78]. At the atomic scale, atom probe tomography has recently been used to evaluate the 3D local chemistry and associated potentials in ionic conductive materials such as doped ceria, revealing the inherent complexity in grain boundary structures [79].…”

2D and 3D Imaging of Li-Ion Battery Materials Using Synchrotron Radiation Sources

“…An extensive review on three dimensional techniques for imaging the physical micro structure of matter over a large range of length scales can be found e.g. in [39].…”

Theoretical modeling of the PEMFC catalyst layer: A review of atomistic methods

“…The three-dimensional microstructural imaging methods are fast growing fields and have recently attracted much attention. A recent publication by Cocco et al[133] highlighted two major advantages of the method, which are less susceptible to errors than indirect or averaging techniques inferring 3D properties and provide realistic geometric information for multi-physics simulations. Besides that, the optical coherence tomography (OCT) and x-ray tomography are used at finer resolution to image PEMFC polymers and to visualize defects directly in thin films.…”