2010
DOI: 10.4314/jast.v15i1-2.54834
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Three dimensional simulated modelling of diffusion capacitance of polycrystalline bifacial silicon solar cell

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Cited by 11 publications
(11 citation statements)
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“… the open circuit transient diffusion capacitance is very brief. It can be seen here that there is a difference between the considered model and that of the cubic grains where the range of operating points of the open circuits is sufficiently long [4].  the short circuit operating points zone is very important and there, the transient diffusion capacitance stretches toward zero ;  a transient diffusion capacitance, depending on operating point which is related to SF, appears between the open circuit operating to the shortcircuit operating points.…”
Section: Resultsmentioning
confidence: 94%
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“… the open circuit transient diffusion capacitance is very brief. It can be seen here that there is a difference between the considered model and that of the cubic grains where the range of operating points of the open circuits is sufficiently long [4].  the short circuit operating points zone is very important and there, the transient diffusion capacitance stretches toward zero ;  a transient diffusion capacitance, depending on operating point which is related to SF, appears between the open circuit operating to the shortcircuit operating points.…”
Section: Resultsmentioning
confidence: 94%
“…This second junction is the seat of the very intense electric field which returns the minority carriers towards the base [3][4][5]. This recombination at the back side of this type of solar cell which are more efficient than the conventional solar cell [3 5].…”
Section: Theorymentioning
confidence: 99%
“…Sf was called junction recombination velocity in our previous papers [22]. Sb is the back surface recombination velocity which traduces excess minority carriers lost at rear side of the solar cell [1]- [3] [8]- [10] [16] [17].…”
Section: Theorymentioning
confidence: 99%
“…Solar cells have seen remarkable improvements despite of some internal and external factors affecting their efficiency. Among internal factors, we can cite the grain boundary recombination velocity (Sgb) [1]- [3] [17], the intrinsic junction recombination velocity (Sf 0 ) [1]- [3] [8]- [10] [15] [17] related to the shunt resistance (Rsh) [2]- [18] due to losses at the junction, the series resistance (Rs) [2] [16] [18], and the back side recombination velocity (Sb) which quantifies the rate at which excess carriers are lost at the back surface of the solar cells [1]- [3] [8]- [10] [16] [17].…”
mentioning
confidence: 99%
“…Equation (4) uses the concept of junction recombination velocity Sf that describes how the minority carrier flow through the junction [5,7,9]. Sf can be written as [5,7,9]:…”
Section: Excess Minority Carrier Densitymentioning
confidence: 99%