“…Considering the anisotropic surface structure of TiO 2 (110), PTRF-XAFS measurements were conducted with three different orientations against the electric 50 vector (E) of the incident X-rays, i.e., two orientations parallel to the surface, E//[001], ̅ and an orientation perpendicular to the surface, E//[110], as reported elsewhere. 5,6,8,9,16,[18][19][20] The polarization dependence of an overall XAFS oscillation obs (k) can be given by equation The Cu Kα fluorescence was detected using a 19-element Ge solid state detector (SSDGL0110S, Canberra, USA). PTRF-XAFS analysis was performed using REX 2000 (Rigaku Co., Japan) for curve fitting analysis and FEFF8.02 code for theoretical simulation of 65 the extended X-ray absorption fine structure (EXAFS) oscillation, cal (k).…”