Three-dimensional visualization of the inner structure of single crystals by step-scanning white X-ray section topography

Abstract

Visualization of the three-dimensional distribution of the crystal defects of large single crystals of calcium fluoride has been demonstrated by white X-ray section topography using sheet-like X-rays (BL28B2 at SPring-8). An image of the three-dimensional distribution of the crystal defects was reconstructed by stacking section topographs, which expressed the images of cross sections of the sample. The section topographs were recorded using a CMOS flat-panel imager or a CCD detector combined with scintillator (Gd(2)O(2)S:Tb) and relay lens system. The section topographs were measured by repeating cycles of exposure and sample translation along the direction perpendicular to the top face of the sample. Using high-brilliance and high-energy white X-rays ( approximately 60 keV) efficiently, visualization of the three-dimensional structure of subgrains of a sample of up to 60 mm in diameter was achieved. Furthermore, the three-dimensional distribution of the glide plane in the crystal was visualized by reconstructing the linear contrast of the glide plane.

Cекционные Методы Рентгеновской Дифракционной Топографии (Обзор)

“…Нельзя не упомянуть о том, что большое количество работ с использованием СИ было выполнено пошаговой регистрацией стоп-кадров в сочетании с линейным и/или угловым перемещением образца. Обработав топограммы при помощи программы визуализации, экспериментаторы получали трехмерные картины распределения дефектов в объеме кристаллов [86][87][88][89][90]. Однако это не количественный подход.…”

X-ray characterization of self-standing bent Si crystal plates for Large Hadron Collider beam extraction

“…By suitable, closely spaced sample translation perpendicular to the illuminated crystal slice [Ás v in Fig. 4(b)], the sample volume can be gradually scanned, enabling the compilation of a truly 3D image by virtual stacking of the recorded images (Kvardakov et al, 2007;Mukaide et al, 2006). The resulting 3D topographic data can be analysed by, for example, visualizing arbitrarily oriented cross sections or by 3D rendering of the volumetric contrast distribution.…”

X‐Ray Topography—More than Nice Pictures

“…[10] Again the improvements concerning the resolution and speed of digital 2D detector systems combined with adequate computing systems allowed in the following a more and more detailed 3D representation of defects in crystals from stocks of digital section topographs. Examples are oxygen precipitates in silicon [54] as well as 3D reconstructions of dislocation networks in CaF 2 [55] and silicon. [56] The 3D reconstruction of the dislocations and small angle grain boundaries in quartz, diamond, and iron achieved from stacks of section scans are also reported by Kvardakov and compared to the topo-tomography, which is another approach for 3D topography.…”