2007
DOI: 10.1002/pssc.200673752
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Threshold displacement energy in yttria‐stabilized zirconia

Abstract: PACS 61.80. Fe, 61.82.Ms, 76.30.Mi We have studied the color center production in yttria-stabilized zirconia single crystals (i.e. ZrO 2 : Y with 9.5 mol% Y 2 O 3 ) with the (100) orientation, by electron irradiations at energies ranging between 1.0 and 2.5 MeV. Electron paramagnetic resonance (EPR) measurements show that three paramagnetic centers are stable at room-temperature: i) an F + -type center (singly ionized oxygen vacancy), ii) the so-called T-center (Zr 3+ in a trigonal oxygen environment), and … Show more

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Cited by 44 publications
(39 citation statements)
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“…On the other hand, a large Ed value (> 120 eV) was deduced for oxygen ions in electron-irradiated YSZ from EPR data on F + centers (paramagnetic oxygen vacancies), which is in good agreement with the MD simulations. 53 The larger value of the Ed for oxygen ions in YSZ is not cleared at the present moment. An explanation for this discrepancy is due to the promoted recombination of oxygen interstitials with structural oxygen vacancies induced by the addition of Y 3+ dopants.…”
Section: Tablementioning
confidence: 65%
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“…On the other hand, a large Ed value (> 120 eV) was deduced for oxygen ions in electron-irradiated YSZ from EPR data on F + centers (paramagnetic oxygen vacancies), which is in good agreement with the MD simulations. 53 The larger value of the Ed for oxygen ions in YSZ is not cleared at the present moment. An explanation for this discrepancy is due to the promoted recombination of oxygen interstitials with structural oxygen vacancies induced by the addition of Y 3+ dopants.…”
Section: Tablementioning
confidence: 65%
“…12,30,48 A number of experimental and theoretical evaluations of Ed were reported for fluorite-type oxides, such as by optical measurements, transmission electron microscopy (TEM), EPR, empirical MD and ab initio MD simulations. 41,43,[49][50][51][52][53][54][55] Table 1 summarizes the reported Ed values of several fluorite-type oxides for cations and oxygen ions. Although the values of Ed depend on materials, crystallographic orientations and Fig.…”
Section: Displacement Energy Of Cations and Anions In Fluorite-type Omentioning
confidence: 99%
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“…The electron energy loss across the films (∼1 keV) is negligible. Therefore, differences between electron irradiations are mainly due to the displacement cross sections (σd) for cerium and oxygen that were computed for the different electron energies with the SMOTT/POLY code [9,29].…”
Section: Methodsmentioning
confidence: 99%
“…Threshold displacement energies for Zr [81], Si [82], and O [83] were assumed to be 40 eV, 35 eV, and 23 eV, respectively. As shown in Fig.…”
Section: Oxidation and Ion Irradiationmentioning
confidence: 99%