2015 IEEE 65th Electronic Components and Technology Conference (ECTC) 2015
DOI: 10.1109/ectc.2015.7159600
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Through Silicon Capacitors (TSC) for noise reduction in Power Distribution Network

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Cited by 7 publications
(1 citation statement)
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“…On the top and bottom sides of the silicon interposer, metal layers (called lids) are used to connect them in parallel, and they present associated parasitic elements (for inductive and resistive effects) that limit the decoupling function. The parasitic effects have then to be modeled and measured from dc to several gigahertz (above the resonance frequency of the components) [7].…”
Section: Modeling and Frequency Performance Analysis Of Through Silicmentioning
confidence: 99%
“…On the top and bottom sides of the silicon interposer, metal layers (called lids) are used to connect them in parallel, and they present associated parasitic elements (for inductive and resistive effects) that limit the decoupling function. The parasitic effects have then to be modeled and measured from dc to several gigahertz (above the resonance frequency of the components) [7].…”
Section: Modeling and Frequency Performance Analysis Of Through Silicmentioning
confidence: 99%