Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review

Prasad, Ananthu; Salim, Nisa V.; Mozetič, Miran; Kailas, Lekshmi; Thomas, Sabu

doi:10.1002/app.52286

Cited by 15 publications

(12 citation statements)

References 55 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…As the primary beam sputters the sample, ToF-SIMS collects three-dimensional compositional data, providing 3D maps for each secondary ion detected with <1 μm 2 lateral resolution. ToF-SIMS is a well-established method for depth profiling inorganic systems, with more recent applications in polymer systems. , Cluster ion beams, with improved high mass sensitivity compared to primary ion sources, have been used successfully to depth profile polystyrene (PS) and polyvinylpyrrolidone (PVP) layers to depths of 15 μm, with depth resolution comparable to ellipsometry (<10 nm) . Depth profiling in ToF-SIMS has also been applied to polymer-based cathode materials, for which dopant and ion concentration distributions determine conductive properties .…”

Section: Introductionmentioning

confidence: 99%

“…For example, surface oxidation causes high yield of secondary ions, skewing counts in the initial frames of collection. 31,33 Depth profiling analysis is likewise complicated by ion beam mixing, reducing depth resolution.…”

Section: ■ Introductionmentioning

confidence: 99%

“…Applying ToF-SIMS to polymer systems has known challenges, especially when using a primary ion source. With primary ion sources like our own, signal intensity in the high mass range is drastically lowered due to the high rate of fragmentation. , The destructive nature of SIMS and the yield-decreasing effects of charging on polymer samples make quantification difficult. ToF-SIMS data analysis is also complicated by the matrix effect, wherein ion yield is dependent on the atom’s local environment.…”

Section: Introductionmentioning

confidence: 99%

“…ToF-SIMS data analysis is also complicated by the matrix effect, wherein ion yield is dependent on the atom’s local environment. For example, surface oxidation causes high yield of secondary ions, skewing counts in the initial frames of collection. , Depth profiling analysis is likewise complicated by ion beam mixing, reducing depth resolution.…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts

2023

View full text Add to dashboard Cite

We apply time-of-flight secondary ion mass spectroscopy (ToF-SIMS) and cross-sectioned trilayer samples to separately measure nanoparticle (NP) and polymer diffusion on micrometer length scales in polymer melts. We fabricate polymer/ diffusing medium/polymer trilayer samples and measure the cross section to extract the NP or deuterated polymer distribution in 3D using ToF-SIMS. After correcting the data for sample tilt, deconvoluting the beam resolution, and integrating the data to extract 1D concentration profiles, we fit the data to extract the diffusion coefficient. These results from cross-sectional ToF-SIMS are in excellent agreement with earlier studies using well-established ion beam methods. This work establishes ToF-SIMS as a reliable tool for measuring NP and polymer diffusion coefficients and opens the door to investigating diffusion in more complex polymer systems and across longer time and length scales.

show abstract

Section: Introductionmentioning

confidence: 99%

Section: ■ Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts

2023

View full text Add to dashboard Cite

show abstract

“…In its future perspective section, this review also calls for standardized methods as well as optimized methods of sample collection and extraction. The fifth review was presented by Prasad et al 108 and discussed the TOF-SIMS analysis of polymer surfaces (59 refs). In the introduction, the review sets out the history of TOF-SIMS and describes its advantages over other surface techniques such as Auger electron spectroscopy and XPS.…”

Section: Organic Chemical and Materialsmentioning

confidence: 99%

Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials

Carter¹,

Clough

Fisher

et al. 2022

J. Anal. At. Spectrom.

View full text Add to dashboard Cite

show abstract

Ionic Liquid‐Mediated Scanning Probe Electro‐Oxidative Lithography as a Novel Tool for Engineering Functional Oxide Micro‐ and Nano‐Architectures

Sadowski

Mangolini

2023

Adv Funct Materials

View full text Add to dashboard Cite

Functional oxides have extensively been investigated as a promising class of materials in a broad range of innovative applications. Harnessing the novel properties of functional oxides in micro‐ to nano‐scale applications hinges on establishing advanced fabrication and manufacturing techniques able to synthesize these materials in an accurate and reliable manner. Oxidative scanning probe lithography (o‐SPL), an atomic force microscopy (AFM) technique based on anodic oxidation at the water meniscus formed at the tip/substrate contact, not only combines the advantages of both “top‐down” and “bottom‐up” fabrication approaches, but also offers the possibility of fabricating oxide nanomaterials with high patterning accuracy. While the use of self‐assembled monolayers (SAMs) broadened the application of o‐SPL, significant challenges have emerged owing to the relatively limited number of SAM/solid surface combinations that can be employed for o‐SPL, which constrains the ability to control the chemistry and structure of oxides formed by o‐SPL. In this work, a new o‐SPL technique that utilizes room‐temperature ionic liquids (RTILs) as the functionalizing material to mediate the electrochemistry at AFM tip/substrate contacts is reported. The results show that the new IL‐mediated o‐SPL (IL‐o‐SPL) approach allows sub‐100 nm oxide features to be patterned on a model solid surface, namely steel, with an initiation voltage as low as −2 V. Moreover, this approach enables high tunability of both the chemical state and morphology of the patterned iron oxide structures. Owing to the high chemical compatibility of ILs, which derives from the possibility of synthesizing ILs able to adsorb on a wide variety of solid surfaces, IL‐o‐SPL can be extended to other material surfaces and provide the opportunity to accurately tailor the chemistry, morphology, and electronic properties within nanoscale domains, thus opening new pathways to the development of novel micro‐ and nano‐architectures for advanced integrated devices.

show abstract

Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review

Cited by 15 publications

References 55 publications

ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts

ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts

Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials

Ionic Liquid‐Mediated Scanning Probe Electro‐Oxidative Lithography as a Novel Tool for Engineering Functional Oxide Micro‐ and Nano‐Architectures

Contact Info

Product

Resources

About