Time of flight-secondary ion mass spectrometry (ToF-SIMS) is a SIMS based surface sensitive technique that provide specific compound identification of surface molecules. Recently, the importance of ToF-SIMS has grown for the characterization and utilization of polymers, pharmaceuticals, semiconductors. The compound specificity of ToF-SIMS distinguishes it from other surface characterization techniques such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and so forth, making it a preferred tool for the effective surface analysis of polymers. The purpose of this review is to elucidate the capability of ToF-SIMS technique to effectively analyze the surface chemistry of polymer materials.

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