Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI)
DOI: 10.1109/icwsi.1995.515444
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Time redundancy for error detecting neural networks

Abstract: Concurrent error detection at an architectural level is ofren a basic requirement to achieve fault tolerance in neural networks Jbr mission-critical applications. Time redundancy allows for concurrent error detection with low circuit complexity. In this paper, the use of alternating logic and complemented logic arle analyzed as low-cost approaches to concurrent error detection. Different architectural approaches for the neural network design are considered to match the implementation constraints.0-7803-2466-8/… Show more

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Cited by 4 publications
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