2013
DOI: 10.1063/1.4819850
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Time-resolved fluorescence up-conversion study of radiative recombination dynamics in III-nitride light emitting diodes over a wide bias range

Abstract: The technique of femtosecond fluorescence up-conversion was employed to explore the transient photoluminescence and carrier decay dynamics in c-plane (In,Ga)N multi-quantum-well light emitting diodes over a wide bias range. By investigating the bias dependence of initial transient photoluminescence intensity and the luminescence lifetime, the field and carrier density effects on the radiative recombination coefficient were revealed for both low and high current injection conditions, and in good agreement with … Show more

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Cited by 3 publications
(4 citation statements)
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“…A similar change has been observed for photoluminescence decay time in a blue LED as function of bias voltage in an experiment with short pulse optical excitation. 25) There, a similar factor-of-three variation from about 14 ns at small forward bias of V bias = 2 V to 4 ns at V bias = −3 V was observed. The decrease in photoluminescence decay time coincided with an increasing photoluminescence intensity, in agreement with our interpretation of the influence of the built-in potential on carrier recombination.…”
Section: Resultssupporting
confidence: 54%
See 1 more Smart Citation
“…A similar change has been observed for photoluminescence decay time in a blue LED as function of bias voltage in an experiment with short pulse optical excitation. 25) There, a similar factor-of-three variation from about 14 ns at small forward bias of V bias = 2 V to 4 ns at V bias = −3 V was observed. The decrease in photoluminescence decay time coincided with an increasing photoluminescence intensity, in agreement with our interpretation of the influence of the built-in potential on carrier recombination.…”
Section: Resultssupporting
confidence: 54%
“…22) We suggested to use this effect to modify and possibly increase LED efficiency by a pulsed mode operation, where carrier injection and carrier recombination occur at different bias: carriers are injected into the QWs during a forward bias, and recombine during a reverse bias when the overlap of electron and hole wave functions are maximized. 23) While the general findings of the impact on bias were confirmed, [24][25][26] the approach did not yet result in a successful demonstration of droop reduction in LEDs. One reason is that state-of-the-art LEDs are optimized for efficiency at forward bias, such minimizing the effect of reverse bias on carrier recombination.…”
Section: Introductionmentioning
confidence: 97%
“…Charge carrier lifetime is commonly used as one of the parameters that describes material quality and determines the overall efficiency of devices [3][4][5]. The parameter is used in characterisation for various devices, such as photovoltaics (PV) [6], laser diodes [7], light-emitting diodes [8] and other semiconductor devices. One of the most established techniques for measuring charge carrier lifetimes is time-resolved photoluminescence (TRPL).…”
Section: Introductionmentioning
confidence: 99%
“…Acquiring spatially-resolved measurements reveals the variations in charge carrier lifetimes across the measured sample, which is useful in terms of understanding the quality of the material [8]. Having the spatial information helps understand the charge carrier diffusion within the material and identify recombination centres [6].…”
Section: Introductionmentioning
confidence: 99%