2002
DOI: 10.1016/s0022-3093(01)01177-2
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Time-resolved layer thickness behavior of microcrystalline and amorphous silicon samples after switching on a hydrogen/silane VHF plasma

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Cited by 7 publications
(6 citation statements)
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“…[17]. Interestingly our results gives some indication on the local growth mechanisms, as the a-Si to mc-Si transition is usually attributed either to an enhancement of the surface diffusion of the SiH x precursors [33] or to a selective etching of the weakly bonded Si atoms [34][35][36][37]. In our case, the increase of the hydrogen content at constant temperature leads to an increase of crystallinity because the selective etching mechanism start to dominate (whereas the surface diffusion remains moderate), while, for constant radical flows, the increase of temperature leads to a strong enhancement of the surface diffusion, leading both to an increase in crystallinity and to a filling of the cracks.…”
Section: Discussionmentioning
confidence: 59%
“…[17]. Interestingly our results gives some indication on the local growth mechanisms, as the a-Si to mc-Si transition is usually attributed either to an enhancement of the surface diffusion of the SiH x precursors [33] or to a selective etching of the weakly bonded Si atoms [34][35][36][37]. In our case, the increase of the hydrogen content at constant temperature leads to an increase of crystallinity because the selective etching mechanism start to dominate (whereas the surface diffusion remains moderate), while, for constant radical flows, the increase of temperature leads to a strong enhancement of the surface diffusion, leading both to an increase in crystallinity and to a filling of the cracks.…”
Section: Discussionmentioning
confidence: 59%
“…In order to explain the plasma-surface interactions in the case of deposition of µc-Si : H from a silane (SiH 4 ) and hydrogen (H 2 ) discharge, three models have been proposed [13][14][15][16][17]: the surface diffusion model, the selective etching model and the chemical annealing model.…”
Section: Review Of µC-si : H Deposition Mechanismsmentioning
confidence: 99%
“…This implies that SiH 3 radicals adsorb onto the surface and diffuse until they find an adequate site to attach. The diffusion length, and thus the crystallinity are greatly improved by hydrogen coverage of the surface, which implies that a sufficient atomic hydrogen flux to the surface is necessary to saturate all surface Si dangling bonds [13][14][15].…”
Section: Review Of µC-si : H Deposition Mechanismsmentioning
confidence: 99%
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“…For the purposes of this study, we will use the term microcrystalline. The mechanisms involved in the deposition of mc-Si:H are complex and not completely understood, however there is a general consensus on the key role of atomic hydrogen in the crystallization of the growing film [33][34][35][36]. So far, most efforts have been devoted to the development of PECVD processes at low silane (SiH 4 ) concentration, on the order of a few percent of the total gas mixture.…”
Section: Process Conditions For Lc-si:h Deposition At 10 å /Smentioning
confidence: 99%