2015
DOI: 10.1103/physrevlett.114.097601
|View full text |Cite
|
Sign up to set email alerts
|

Time-Resolved X-Ray Diffraction Reveals the Hidden Mechanism of High Piezoelectric Activity in a Uniaxial Ferroelectric

Abstract: High piezoelectric activity of many ferroelectrics has been the focus of numerous recent studies. The structural origin of this activity remains poorly understood due to a lack of appropriate experimental techniques and mixing of different mechanisms related to ferroelectricity and ferroelasticity. Our work reports on the study of a uniaxial Sr 0.5 Ba 0.5 Nb 2 O 6 ferroelectric where the formation of regions with different spontaneous strains is ruled out for the symmetry reason and where the interrelation bet… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
17
0

Year Published

2016
2016
2023
2023

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 20 publications
(17 citation statements)
references
References 57 publications
0
17
0
Order By: Relevance
“…The time-resolved X-ray diffraction data were acquired using a bespoke stroboscopic data acquisition system operating on the principle of a multi-channel analyser, and providing an ideal platform for the investigation of repetitive processes down to the nanosecond time scale 19 21 33 . Similar stroboscopic approaches have previously been applied to the determination of small (~10 −4 Å) electric field induced bond distortions 18 19 20 , the determination of piezoelectric coefficients 34 , the study of ferroelectric ceramics 11 12 35 and single crystals 22 . In the configuration used here, the system used 10000 time channels of width 2 μs, later binned by a factor of 20 to improve the counting statistics at a temporal resolution (i.e.…”
Section: Methodsmentioning
confidence: 96%
See 1 more Smart Citation
“…The time-resolved X-ray diffraction data were acquired using a bespoke stroboscopic data acquisition system operating on the principle of a multi-channel analyser, and providing an ideal platform for the investigation of repetitive processes down to the nanosecond time scale 19 21 33 . Similar stroboscopic approaches have previously been applied to the determination of small (~10 −4 Å) electric field induced bond distortions 18 19 20 , the determination of piezoelectric coefficients 34 , the study of ferroelectric ceramics 11 12 35 and single crystals 22 . In the configuration used here, the system used 10000 time channels of width 2 μs, later binned by a factor of 20 to improve the counting statistics at a temporal resolution (i.e.…”
Section: Methodsmentioning
confidence: 96%
“…Time-resolved X-ray diffraction is also a powerful tool for measuring structural dynamics (e.g. 21 22 ).…”
mentioning
confidence: 99%
“…There are some transient effects close to the times of the pulses themselves, which are asymmetric for the positive and negative pulse (c.f. the anisotropy visible in the switching in Figure 3 and in in-situ diffraction experiments on other compounds [40,44]), and which depend on the movements of the atoms switching mechanism [40]. However, the main effect is that, in between the pulses, the intensity is clearly above average in the interval after the application of the negative pulse and below average in the interval after the application of the positive field pulse.…”
Section: Time-resolved X-ray Diffraction With Voltage Pulses Applied mentioning
confidence: 89%
“…The measurements then have to be conducted and time-resolved, with electronic coordination between voltage pulses, detector read-out and diffractometer movements. To this extent, we adapted a setup for time-resolved diffraction, which had been previously used primarily for studying piezoelectric samples, for the synchrotron beamline P09 [41] of PETRAIII [40,[42][43][44][45]. We chose a photon energy of 8.55 keV, sufficiently far above the Fe K edge to suppress resonant scattering effects and EXAFS (extended x-ray absorption fine structure) , but close enough to provide for a significant imaginary part of the Fe scattering factor.…”
Section: Time-resolved X-ray Diffraction With Voltage Pulses Applied mentioning
confidence: 99%
“…Time-resolved x-ray diffraction data were acquired using a bespoke stroboscopic multi-channel analyzer data acquisition system (10 000 data channels). [20][21][22][23][24][25][26] Measured data were later binned by a factor of 20 to improve the counting statistics, resulting in a final time resolution of 40 ls. The electric current was monitored using an active probe measuring the voltage drop across a 1 kX active resistor with a resolution of 6 ls using a Rohde and Schwarz oscilloscope (HMO3044, Hameg, Germany).…”
mentioning
confidence: 99%