2021
DOI: 10.1016/j.apsusc.2020.148510
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TiO2-SiO2 mixed oxide deposited by low pressure PECVD: Insights on optical and nanoscale electrical properties

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Cited by 13 publications
(14 citation statements)
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“…To investigate the chemical composition of the TiO2 in SiO2 NC and of the TixSi1-xO2 MO thin films, at the very surface, XPS measurements were carried out. Concerning MO, the results confirm that we manage to elaborated TixSi1-xO2 films with a Ti atomic percentage of 0%, 33%, 49% and 54 % which correspond to x = 0, 0.33, 0.49 and 0.54 respectively [6]. Concerning NC, XPS results are reported in Table I and compare to those provided by the SE and the BEMA model concerning the volume fraction of TiO2 NPs [12].…”
Section: A Morphology and Structural Characterizationsupporting
confidence: 69%
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“…To investigate the chemical composition of the TiO2 in SiO2 NC and of the TixSi1-xO2 MO thin films, at the very surface, XPS measurements were carried out. Concerning MO, the results confirm that we manage to elaborated TixSi1-xO2 films with a Ti atomic percentage of 0%, 33%, 49% and 54 % which correspond to x = 0, 0.33, 0.49 and 0.54 respectively [6]. Concerning NC, XPS results are reported in Table I and compare to those provided by the SE and the BEMA model concerning the volume fraction of TiO2 NPs [12].…”
Section: A Morphology and Structural Characterizationsupporting
confidence: 69%
“…In addition, in both cases, the films and NC growth was monitored with in situ ellipsometry with real-time fitting, allowing to stop deposition when the targeted thickness (50 nm) was reached. Thickness values were obtained thanks to a robust fitting model, fully validated for higher thicknesses [6]. We are thus confident that the targeted thicknesses were achieved.…”
Section: Experiments a Materialsmentioning
confidence: 94%
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“…To avoid this behavior, mixed oxides such as Ti x Si 1-x O 2 have been developed. However, Ti x Si 1-x O 2 films which exhibit low leakage current do not offer enough increase of their dielectric permittivity increase [8]. In a second approach, high-k multilayers stacking or nanolaminates were investigated since they lead to a reduction in leakage current and an increase in ε r which depends on the number of layers [1].…”
Section: Introductionmentioning
confidence: 99%