TLP Characterization and Leakage-Biasing-Voltage (VLB) Correlations in MOSFET Measurements

Chen, Shen Li; Lee, Min Hua

doi:10.1109/is3c.2014.62

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TLP Characterization and Leakage-Biasing-Voltage (VLB) Correlations in MOSFET Measurements

Cited by 3 publications

References 9 publications

Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

Analysis of ESD effects on organic thin-film-transistors by means of TLP technique

ESD Damage Model of Spacecraft MOS Devices under Arc Discharge

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