2016
DOI: 10.1021/acs.analchem.6b02415
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ToF-SIMS and Laser-SNMS Imaging of Heterogeneous Topographically Complex Polymer Systems

Abstract: Heterogeneous polymer coatings, such as those used in organic electronics and medical devices, are of increasing industrial importance. In order to advance the development of these types of systems, analytical techniques are required which are able to determine the elemental and molecular spatial distributions, on a nanometer scale, with very high detection efficiency and sensitivity. The goal of this study was to investigate the suitability of laser postionization secondary neutral mass spectrometry (Laser-SN… Show more

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Cited by 19 publications
(12 citation statements)
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“…There are other laboratory analytical techniques, which offer high spatial resolution depth profiling capabilities such as Glow Discharge Mass Spectrometry (GD-MS), Laser Ablation Inductively Coupled Mass Spectrometry (LA-ICP-MS) and Secondary Ion Mass Spectrometry (SIMS) [35][36][37][38][39][40] . These instruments in current state of development are less suitable for application to space research but can be useful in applications in terrestrial environments.…”
Section: Introductionmentioning
confidence: 99%
“…There are other laboratory analytical techniques, which offer high spatial resolution depth profiling capabilities such as Glow Discharge Mass Spectrometry (GD-MS), Laser Ablation Inductively Coupled Mass Spectrometry (LA-ICP-MS) and Secondary Ion Mass Spectrometry (SIMS) [35][36][37][38][39][40] . These instruments in current state of development are less suitable for application to space research but can be useful in applications in terrestrial environments.…”
Section: Introductionmentioning
confidence: 99%
“…Resonant photoionization suffers from a loss in analytical flexibility since it is element and even isotope specific, but due to higher cross sections it results in even higher useful yields compared to the non-resonant process [15]. Resonant Laser-SNMS has already been successfully applied to various sample types such as crystalline materials, doped semi-conductors, ocean sediments, and organic polymers [20][21][22][23][24][25], and has proven to be adequate for the analysis of radioactive samples [26][27][28][29][30] using fully custom-built TOF-MS as well as adapted commercially available TOF-SIMS instruments in combination with a wide range of laser systems.…”
Section: Introductionmentioning
confidence: 99%
“…by implanting ions for doping or defect engineering) [1][2][3][4], cleaning, etching or patterning the surface by sputtering (i.e. the removal of surface material) [5][6][7][8], fabrication of thin films (by collecting the sputtered material on a substrate) [9,10], imaging [11], or chemical surface analysis via mass spectrometry of the sputtered material [12][13][14].…”
Section: Introductionmentioning
confidence: 99%