2006
DOI: 10.1016/j.sna.2005.08.002
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Tolerance analysis for comb-drive actuator using DRIE fabrication

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Cited by 41 publications
(37 citation statements)
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“…One of the special features of the fabrication is that a dry release approach is adopted rather than the wet etching to release the movable structures. This is to avoid the stiction problem, which happens easily due to the capillary forces that occur during the rinsing and drying of wet release [21], [22], [28], [29]. The basic idea of dry release approach is to first obtain deep trenches by vertical anisotropic etching as usual, but then to have the lateral etching process by the use of the notching effect when the remained silicon structure is close to the buried layer while the vertical etched beam is protected by thin silicon dioxide layer.…”
Section: Device Fabrication and Experiemntal Resultsmentioning
confidence: 99%
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“…One of the special features of the fabrication is that a dry release approach is adopted rather than the wet etching to release the movable structures. This is to avoid the stiction problem, which happens easily due to the capillary forces that occur during the rinsing and drying of wet release [21], [22], [28], [29]. The basic idea of dry release approach is to first obtain deep trenches by vertical anisotropic etching as usual, but then to have the lateral etching process by the use of the notching effect when the remained silicon structure is close to the buried layer while the vertical etched beam is protected by thin silicon dioxide layer.…”
Section: Device Fabrication and Experiemntal Resultsmentioning
confidence: 99%
“…By well controlling the process parameters, the movable structures can be released without significant sacrifice of the depth of the silicon structure. The details of the process can be found in [21], [22]. Compared with the wet etching method that removes the buffer oxide, the dry release approach removes the bottom of the silicon structural layer to release the moving parts and thus does not need any wet process.…”
Section: Device Fabrication and Experiemntal Resultsmentioning
confidence: 99%
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“…The defects, therefore, are the one and only factor left to giving rise to the sensitivity jump. The defects in micro structures are mainly caused by the micro manufacturing process, for example, the dry/wetetching induces sidewall roughness or angled grooves, the over-etching results in concave defects and under-etching leads to convex defects [20]- [24]. Both the roughness and concaves impact the stiffness of micro beams only in the form of nonlinearity, while the convex on beam will change the effective stiffness by stopping the movement of a certain segment of beam when the deformation forms a contact between two adjacent parts.…”
Section: Analysis and Derivationmentioning
confidence: 99%