2015
DOI: 10.1002/jemt.22580
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Topographic characterization of unworn contact lenses assessed by atomic force microscopy and wavelet transform

Abstract: This paper analyses the three-dimensional (3-D) surface morphology of optic surface of unworn contact lenses (CLs) using atomic force microscopy (AFM) and wavelet transform. Refractive powers of all lens samples were 2.50 diopters. Topographic images were acquired in contact mode in air-conditioned medium (35% RH, 23°C). Topographic measurements were taken over a 5 µm × 5 µm area with 512 pixel resolution. Resonance frequency of the tip was 65 kHz. The 3-D surface morphology of CL unworn samples revealed (3-D)… Show more

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Cited by 9 publications
(3 citation statements)
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“…Recently was reported (Ţălu, Stępień, & Caglayan, ) about wavelet analysis to characterize the 3D surface morphology. Wavelet analysis also provides information about irregularity of topography (Stępień, ).…”
Section: Introductionmentioning
confidence: 99%
“…Recently was reported (Ţălu, Stępień, & Caglayan, ) about wavelet analysis to characterize the 3D surface morphology. Wavelet analysis also provides information about irregularity of topography (Stępień, ).…”
Section: Introductionmentioning
confidence: 99%
“…As mother wavelets differ in properties, it is important that appropriate wavelets be selected for signal analysis and this can be done statistically [27]. Some mother wavelets used in signal analysis are able to improve image resolution or isolate and identify patterns that cannot be detected otherwise [28].…”
Section: Roughnessmentioning
confidence: 99%
“…The evaluation of 3‐D surface microtexture of CLs at a micro/nano level (Giovanzana, Ţălu, & Nicoară, 2020; Ţălu, 2013; Ţălu, Stępień, & Caglayan, 2015) have been dedicated in last decade based on new modern mathematical tools (Ţălu, 2012b; Ţălu, Bramowicz, Kulesza, Fiorillo, & Giovanzana, 2017; Ţălu & Stach, 2014).…”
Section: Introductionmentioning
confidence: 99%