Toward Determination of the Surface Roughness of Particles from a SEM Image

Abstract

Determination of surface roughness of micro-and nanoparticles is a challenging problem that does not have a general solution. Instead, one adopts solutions specific to an application. Some solutions are the use of atomic force microscopy (AFM) [1], or the evaluation of the fluctuations from a circular circumference of the projected profile extracted from a transmission electron microscopy (TEM) image [2].