2021
DOI: 10.1016/j.surfcoat.2021.127120
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Toward energy-efficient physical vapor deposition: Routes for replacing substrate heating during magnetron sputter deposition by employing metal ion irradiation

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Cited by 31 publications
(6 citation statements)
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“…Depositions of (Ti 1- y Al y ) 1- x W x N films are performed in an industrial CC800/9 magnetron sputtering system from CemeCon AG (Würselen, Germany) using a hybrid W-HiPIMS/TiAl-DCMS scheme, with a pulsed W + -flux provided by the W target operated in HiPIMS mode while Ti + - and Al + -fluxes are generated by two TiAl DC targets symmetrically placed on both sides of the W target 20 , 21 . TiAl DC targets are composed of Ti plates (Ti > 99 wt%) with 15 mm diameter Al plugs (Al > 99 wt%) distributed along the racetrack.…”
Section: Methodsmentioning
confidence: 99%
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“…Depositions of (Ti 1- y Al y ) 1- x W x N films are performed in an industrial CC800/9 magnetron sputtering system from CemeCon AG (Würselen, Germany) using a hybrid W-HiPIMS/TiAl-DCMS scheme, with a pulsed W + -flux provided by the W target operated in HiPIMS mode while Ti + - and Al + -fluxes are generated by two TiAl DC targets symmetrically placed on both sides of the W target 20 , 21 . TiAl DC targets are composed of Ti plates (Ti > 99 wt%) with 15 mm diameter Al plugs (Al > 99 wt%) distributed along the racetrack.…”
Section: Methodsmentioning
confidence: 99%
“…A calibrated thermocouple placed near the center of the stationary substrates is used to measure the temperature during the entire process, as shown in the schematic diagram of the deposition system in Ref. 20 . Two resistance heaters placed symmetrically on the front and back sides of the chamber produce heat for degassing the chamber before deposition, so that the base pressure reaches 0.3 mPa (2.25 × 10 –6 Torr).…”
Section: Methodsmentioning
confidence: 99%
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“…A pulsed substrate bias voltage of either − 120 or − 480 V were synchronized with the HiPIMS pulses. The two levels of bias voltage were used to alter the ion subplantation depth [21,[28][29][30]. Substrate bias was set with 30 μs delay after HiPIMS pulse ignition and 100 μs pulse length to capture the metal ion rich portion during the HiPIMS pulses, while growing films in the stationary configuration [22].…”
Section: Film Depositionmentioning
confidence: 99%
“…The target to substrate distance determines the time delay between the magnetron and bias voltage pulses which is primarily investigated by mass spectroscopy. In general, this method has been demonstrated for static configurations, i.e., the target to substrate separation remains constant once the optimum time delay has been selected [2].…”
Section: Introductionmentioning
confidence: 99%