2022
DOI: 10.1088/2632-2153/ac3844
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Towards automating structural discovery in scanning transmission electron microscopy *

Abstract: Scanning transmission electron microscopy (STEM) is now the primary tool for exploring functional materials on the atomic level. Often, features of interest are highly localized in specific regions in the material, such as ferroelectric domain walls, extended defects, or second phase inclusions. Selecting regions to image for structural and chemical discovery via atomically resolved imaging has traditionally proceeded via human operators making semi-informed judgements on sampling locations and parameters. Rec… Show more

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Cited by 17 publications
(15 citation statements)
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“…Furthermore, the use of batch updates further necessitates the selection of pathfinder function, i.e., defining the sampling sequence under the constraints of microscope operation, representing a known example of a NP hard problem that we never come back to exactly where we were. Finally, GP will still be expected to require a considerable number of sampling points, and although it can reduce the experimental budget to 10–30% of grid measurements, the trade-off is that it renders the experimental procedure considerably more complex …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Furthermore, the use of batch updates further necessitates the selection of pathfinder function, i.e., defining the sampling sequence under the constraints of microscope operation, representing a known example of a NP hard problem that we never come back to exactly where we were. Finally, GP will still be expected to require a considerable number of sampling points, and although it can reduce the experimental budget to 10–30% of grid measurements, the trade-off is that it renders the experimental procedure considerably more complex …”
Section: Resultsmentioning
confidence: 99%
“…Finally, GP will still be expected to require a considerable number of sampling points, and although it can reduce the experimental budget to 10−30% of grid measurements, the trade-off is that it renders the experimental procedure considerably more complex. 86 Overall, the results shown above yield several conclusions. For scanning with nonrectangular trajectories with fixed sampling points, the GP method allows for image reconstruction and offers a less than order of magnitude improvement in sampling.…”
Section: Resultsmentioning
confidence: 99%
“…The development of an autonomous TEM, capable of automatically and independently executing all of these steps, would greatly enhance the efficiency of materials science research. In recent years, relevant research has commenced, primarily focusing on self-driving microscope, machine learning, or AI-dominated data analysis and image processing. …”
Section: Discussionmentioning
confidence: 99%
“…is the distance loss between the prior p (z) distribution (usually chosen as standard Gaussian) and the posterior p(z|x) distributions of the latent representation from data. Different VAE models have been applied to materials systems, in attempt to learn from complex image data [11,38,[42][43][44].…”
Section: Jrvaementioning
confidence: 99%