2021
DOI: 10.1088/0256-307x/38/2/028101
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Towards Fabrication of Atomic Dopant Wires via Monolayer Doping Patterned by Resist-Free Lithography

Abstract: Fabrication of atomic dopant wires at large scale is challenging. We explored the feasibility to fabricate atomic dopant wires by nano-patterning self-assembled dopant carrying molecular monolayers via a resist-free lithographic approach. The resist-free lithography is to use electron beam exposure to decompose hydrocarbon contaminants in vacuum chamber into amorphous carbon that serves as an etching mask for nanopatterning the phosphorus-bearing monolayers. Dopant wires were fabricated in silicon by patternin… Show more

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“…For instance, arylphosphonic acids have been used to engineer the electronic properties of atomically thin sheets of semiconducting transition-metal dichalcogenides . Doping of silicon and other bulk semiconductors has been achieved by means of SAM of P-containing molecules in the so called monolayer doping approach. ,, This approach relies on the formation of a SAM over the semiconductor surface and subsequent injection of the dopant into the substrate by a high-temperature thermal treatment. The described procedure has been used to enable the formation of sub 5 nm ultrashallow junctions in Si. , Interesting exploitation perspectives are also expected for photovoltaic applications, which usually require effective approaches to reduce the cost of the devices .…”
Section: Introductionmentioning
confidence: 99%
“…For instance, arylphosphonic acids have been used to engineer the electronic properties of atomically thin sheets of semiconducting transition-metal dichalcogenides . Doping of silicon and other bulk semiconductors has been achieved by means of SAM of P-containing molecules in the so called monolayer doping approach. ,, This approach relies on the formation of a SAM over the semiconductor surface and subsequent injection of the dopant into the substrate by a high-temperature thermal treatment. The described procedure has been used to enable the formation of sub 5 nm ultrashallow junctions in Si. , Interesting exploitation perspectives are also expected for photovoltaic applications, which usually require effective approaches to reduce the cost of the devices .…”
Section: Introductionmentioning
confidence: 99%