2016
DOI: 10.1088/0022-3727/49/12/125602
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Towards high performance Cd-free CZTSe solar cells with a ZnS(O,OH) buffer layer: the influence of thiourea concentration on chemical bath deposition

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Cited by 44 publications
(31 citation statements)
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“…For instance CdS is not suitable at high S content in the absorber because of a negative CBO ("cliff" alignment) 12,27 . As far as Cd&CRM-free buffer layers are concerned: CBO with ZnO (-0.1 eV) can lead to low VOC 56 , ZnSnO has a suitable CBO with CZTSSe for various S content in absorber [27][28] and if CBO with ZnS(O,OH) can be correctly adjusted 57 , inhomogeneity in this buffer layer can drastically reduce VOC 29 . Insufficient buffer coverage can also lead to decreased VOC 58 .…”
Section: Mapping Of Fundamental Failures In Cd-free Kesterite Solar Cmentioning
confidence: 99%
“…For instance CdS is not suitable at high S content in the absorber because of a negative CBO ("cliff" alignment) 12,27 . As far as Cd&CRM-free buffer layers are concerned: CBO with ZnO (-0.1 eV) can lead to low VOC 56 , ZnSnO has a suitable CBO with CZTSSe for various S content in absorber [27][28] and if CBO with ZnS(O,OH) can be correctly adjusted 57 , inhomogeneity in this buffer layer can drastically reduce VOC 29 . Insufficient buffer coverage can also lead to decreased VOC 58 .…”
Section: Mapping Of Fundamental Failures In Cd-free Kesterite Solar Cmentioning
confidence: 99%
“…The previously stated CZTS‐records are actually both with CdS‐based buffers but with an addition of In and Zn, respectively, to improve performance . Previous work on alternative buffer layers for CZTSSe has been done on ZnO, Zn(O,S), ZnS(O,OH), (Zn,Mg)O, Zn 1−x Cd x S, In 2 S 3 and an “In‐based” buffer …”
Section: Introductionmentioning
confidence: 99%
“…Among the different alternatives to CdS, Zn(O,S) alloys have been reported as one of the most promising candidates, and high efficiency devices up to 21% efficiency have already been reported with these layers. [3][4][5][6][7] In this case, control of the O/S content ratio is very important in order to ensure an optimal moderate spike-like conduction band alignment at the absorber/buffer heterojunction. 8 However, the analysis of the anion ratio of these buffer layers by non-destructive techniques is still challenging, being the use of techniques as X-ray uo-rescence or X-ray diffraction compromised by either the presence of interactions between the S and Mo signals (being the back contact in the cells constituted by a Mo thin lm) or their very small thickness (typically in the range 20-80 nm).…”
Section: Introductionmentioning
confidence: 99%