2016
DOI: 10.3749/canmin.1500104
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Trace Element Distribution (Cu, Ga, Ge, Cd, and Fe) IN Sphalerite From the Tennessee MVT Deposits, USA, By Combined EMPA, LA-ICP-MS, Raman Spectroscopy, and Crystallography

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Cited by 74 publications
(22 citation statements)
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“…values, calculated from the individual elemental values from LA-ICP line scans, are given in brackets. For the Merelani sample, the mean Cu value for wurtzite is 1267 (26) ppm and that for the sphalerite region 1932(80) ppm. The mean Cd values for the Merelani wurtzite is 3582(60) ppm and for the sphalerite it is 2982(67) ppm.…”
Section: Resultsmentioning
confidence: 94%
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“…values, calculated from the individual elemental values from LA-ICP line scans, are given in brackets. For the Merelani sample, the mean Cu value for wurtzite is 1267 (26) ppm and that for the sphalerite region 1932(80) ppm. The mean Cd values for the Merelani wurtzite is 3582(60) ppm and for the sphalerite it is 2982(67) ppm.…”
Section: Resultsmentioning
confidence: 94%
“…O'Keefe and Hyde [19], pointed out that in compounds that only have a wurtzite form and no sphalerite analogue, such as zincite (ZnO), the cation-cation distances are close to the sum of the non-bonded radii. That is, the wurtzite form can be stabilized over the sphalerite form by cation-cation repulsions and this is consistent with wurtzite being sulfur-deficient and sphalerite cation-deficient.The minor and trace element chemistry of sphalerite has been the subject of much study, as has the structural nature of the coupled substitutions involved [20][21][22][23][24][25][26][27][28], but a similar study of wurtzite is lacking. In many of the above compositional studies the structural form of the ZnS were not confirmed by X-ray diffraction methods as sphalerite and some of the samples maybe have actually been intergrowths of polytypes.…”
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confidence: 99%
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“…The positions of the main peak determined by the XANES calculations were the same as those of the experimental spectra: 11,106.5 eV for Ge metal, 11,107.5 eV for GeI2, 11,109 eV for renierite, and 11,112 eV for GeO2. The methods for LA-ICP-MS (Agilent Technologies, Santa Clara, UT, USA) and EMPA (Cameca, Gennevilliers, France) are described in [25]. SEM images were performed using a JEOL J7600F scanning electron microscope (SEM, JEOL, Akishima, Japan) equipped with an SDD-type EDS spectrometer coupled to an Oxford Wave WDS spectrometer.…”
Section: Methodsmentioning
confidence: 99%
“…Samples consisted of massive sphalerite in a thin section, but at a microscopic scale, they consisted of micro crystalline sphalerite. A more detailed description of the samples is available in Reference [25]. The Tennessee mining province is divided into two mining districts: Central Tennessee (CT) and East Tennessee (ET).…”
Section: Sphalerite Samplesmentioning
confidence: 99%