2010
DOI: 10.1016/j.nimb.2010.05.078
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Track creation after swift heavy ion irradiation of insulators

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Cited by 16 publications
(7 citation statements)
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References 21 publications
(41 reference statements)
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“…The importance of the excess energy accumulated in valence holes for the relaxation kinetics in SHI tracks was demonstrated very recently in [7,8]. That may indicate the necessity of introducing into the heat balance equations of (a) the temperature of valence holes as the third temperature in the TSM, and (b) a spatially distributed heat source term resulted from release of the potential energy due to decay of valence holes generated by fast electrons [9].…”
Section: Introductionmentioning
confidence: 96%
“…The importance of the excess energy accumulated in valence holes for the relaxation kinetics in SHI tracks was demonstrated very recently in [7,8]. That may indicate the necessity of introducing into the heat balance equations of (a) the temperature of valence holes as the third temperature in the TSM, and (b) a spatially distributed heat source term resulted from release of the potential energy due to decay of valence holes generated by fast electrons [9].…”
Section: Introductionmentioning
confidence: 96%
“…35 Figure 5 shows the calculated electron density for different times after the ion impact obtained from the MC method. The spatial and temporal evolution of the density is governed by three major mechanisms 8,9,20 following the initial excitation: the electron transport, which moves electrons away from the center of the track, the secondary electron ionizations, which increase the total number of electrons most efficiently at short timescales, and the Auger recombinations of deep atomic shells, which increase the number of electrons most pronounced in the track core.…”
Section: Resultsmentioning
confidence: 99%
“…[10][11][12][13][14][15][16][17] Recently, it has been used for studying excitation and relaxation of electrons irradiated with SHI or laser pulses. 8,[16][17][18][19][20] Within the method, each process occurring with each particle in the system is considered event by event. Every particle undergoes a collision process with a certain probability.…”
Section: A Monte Carlo Methodsmentioning
confidence: 99%
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