Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets

Yuan, Renliang; Zhang, Jiong; He, Lingfeng; Zuo, Jian

doi:10.1016/j.ultramic.2021.113256

Cited by 29 publications

(18 citation statements)

References 36 publications

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“…Each grain is colored based on the crystallographic direction oriented parallel to the electron beam direction (see the color-coded stereographic inset). The misorientation angle distribution measured agrees well with polycrystalline cubic structures full of randomly oriented grains [220].…”

Section: Measuring Gb Charactersupporting

confidence: 76%

A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy

et al. 2021

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Interfaces such as grain boundaries (GBs) and heterointerfaces (HIs) are known to play a crucial role in structure-property relationships of polycrystalline materials. While several methods have been used to characterize such interfaces, advanced transmission electron microscopy (TEM) and scanning TEM (STEM) techniques have proven to be uniquely powerful tools, enabling quantification of atomic structure, electronic structure, chemistry, order/disorder, and point defect distributions below the atomic scale. This review focuses on recent progress in characterization of polycrystalline oxide interfaces using S/TEM techniques including imaging, analytical spectroscopies such as energy dispersive X-ray spectroscopy (EDXS) and electron energy-loss spectroscopy (EELS) and scanning diffraction methods such as precession electron nano diffraction (PEND) and 4D-STEM. First, a brief introduction to interfaces, GBs, HIs, and relevant techniques is given. Then, experimental studies which directly correlate GB/HI S/TEM characterization with measured properties of polycrystalline oxides are presented to both strengthen our understanding of these interfaces, and to demonstrate the instrumental capabilities available in the S/TEM. Finally, existing challenges and future development opportunities are discussed. In summary, this article is prepared as a guide for scientists and engineers interested in learning about, and/or using advanced S/TEM techniques to characterize interfaces in polycrystalline materials, particularly ceramic oxides.

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Section: Measuring Gb Charactersupporting

confidence: 76%

A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy

et al. 2021

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“…Many 4D-STEM experimental methods require fine enough sampling of reciprocal space to resolve the edges of scattered Bragg disks, or fine details inside the unscattered and scattered Bragg disks (Ophus, 2019). In particular, for machine learning methods which are trained on simulated data, we want the sampling and image sizes to be as close to the experimental parameters as possible (Xu & LeBeau, 2018; Yuan et al, 2021). Here, compare the PRISM and partitioned PRISM algorithms for 4D-STEM simulations and assess their accuracy by performing a common 4D-STEM workflow of strain mapping by measuring the Bragg disk spacing (Pekin et al, 2017).…”

Section: Resultsmentioning

confidence: 99%

A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations

et al. 2021

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“…A scanning transmission electron microscopy (STEM) image was used to identify features smaller than STXM could resolve. Data used here have been presented in prior work, and the experimental details of these measurements are given in that work (Yuan et al, 2021).…”

Section: Scanning Transmission Electron Microscopymentioning

confidence: 99%

“…FIB sections have been studied on a variety of samples from environmental (Benzerara et al, 2007) to archeological (Michelin et al, 2013;Bernard et al, 2009Bernard et al, , 2007 to interplanetary (Yabuta et al, 2014;Uesugi et al, 2014;Ito et al, 2020;Gu et al, 2020). FIB sections have also been used to study spent nuclear fuel recently (Clark et al, 2020;Kessler et al, 2020;Yuan et al, 2021;Liu et al, 2021;Teague & Gorman, 2014;Degueldre et al, 2016;Degueldre & Veleva, 2014). These studies have mainly utilized transmission electron microscopy (TEM) and transmission extended X-ray absorption fine structure (EXAFS), which also require thin samples, especially TEM.…”

Section: Introductionmentioning

confidence: 99%

Chemical and elemental mapping of spent nuclear fuel sections by soft X-ray spectromicroscopy

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et al. 2022

J Synchrotron Radiat

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Soft X-ray spectromicroscopy at the O K-edge, U N 4,5-edges and Ce M 4,5-edges has been performed on focused ion beam sections of spent nuclear fuel for the first time, yielding chemical information on the sub-micrometer scale. To analyze these data, a modification to non-negative matrix factorization (NMF) was developed, in which the data are no longer required to be non-negative, but the non-negativity of the spectral components and fit coefficients is largely preserved. The modified NMF method was utilized at the O K-edge to distinguish between two components, one present in the bulk of the sample similar to UO2 and one present at the interface of the sample which is a hyperstoichiometric UO2+x species. The species maps are consistent with a model of a thin layer of UO2+x over the entire sample, which is likely explained by oxidation after focused ion beam (FIB) sectioning. In addition to the uranium oxide bulk of the sample, Ce measurements were also performed to investigate the oxidation state of that fission product, which is the subject of considerable interest. Analysis of the Ce spectra shows that Ce is in a predominantly trivalent state, with a possible contribution from tetravalent Ce. Atom probe analysis was performed to provide confirmation of the presence and localization of Ce in the spent fuel.

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Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets

Cited by 29 publications

References 36 publications

A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy

A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy

A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations

Chemical and elemental mapping of spent nuclear fuel sections by soft X-ray spectromicroscopy

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