2000
DOI: 10.1063/1.126545
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Trajectory overlaps and local magnification in three-dimensional atom probe

Abstract: Local magnification effects related to the presence of a second phase in three-dimensional atom probe have been investigated using a simulation of ion trajectories from the analyzed sample surface. Spherical precipitates containing only B atoms embedded in pure A solid solution were considered. The magnification was found to vary drastically from 0.5 to 2.0 times when the evaporation field of B (EB) was varied from 1.15 EA to 0.85 EA. The trajectories were found to overlap over distances close to 1 nm only whe… Show more

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Cited by 409 publications
(280 citation statements)
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“…It is well known that APT 3D reconstructed volumes can be affected by local magnification effects if different phases with different evaporation fields are evaporated simultaneously [33]. The predicted evaporation fields for chromium (Cr + , 27 V.nm -1 ) and copper (Cu + 30V.nm -1 ) are slightly different [34].…”
Section: Methodsmentioning
confidence: 99%
“…It is well known that APT 3D reconstructed volumes can be affected by local magnification effects if different phases with different evaporation fields are evaporated simultaneously [33]. The predicted evaporation fields for chromium (Cr + , 27 V.nm -1 ) and copper (Cu + 30V.nm -1 ) are slightly different [34].…”
Section: Methodsmentioning
confidence: 99%
“…We now comment on interface sharpness as determined by HREM and 3DAP microscopies. For a 3DAP microscope analysis direction parallel to the interface plane, there exists the possibility of field-evaporation trajectory effects [19] because each phase field-evaporates at slightly different values of the local electric field. Therefore, when two phases field-evaporate simultaneously, their different fieldevaporation characteristics must be taken into account when interpreting the 3D reconstruction [20].…”
Section: Chemical Analysis: Three-dimensional Atom-probe Microscope Imentioning
confidence: 99%
“…The latter technique involves the atom-by-atom field evaporation of a material by an applied voltage, in order to provide a timeof-flight mass spectrum and the position of each atom in the tip. 9,10 Although the influence of the shape, crystallography and chemical composition of an APT needle on ion trajectories 11 can be simulated numerically 12 and models of the dielectric properties of embedded nanoparticles can be fitted to experimental measurements, 13 the development of a technique that can be used to measure the electric field around such a needle, or equivalently the charge distribution within it, promises to provide a more direct method for minimising artefacts in the reconstructed volume. 10 Off-axis electron holography provides direct access to the phase shift …”
Section: Introductionmentioning
confidence: 99%