As previously shown the transient single‐injection current flow in dielectrics in the presence of trapping is determined by one of six qualitatively different mechanisms. In the present paper an algorithm of mechanism determination based on the analysis of the total current and electric field strength on the injecting interface variations in time is proposed. A mechanism of transient single‐injection current in the MNOS structure is determined and electrophysical parameters governing the process are estimated. It is confirmed experimentally that an exponential law of carrier emission from the injecting interface into the dielectric conduction band results in a current decay according to a 1/t law and in a field decrease on the injecting interface according to a logarithmic law.