2013 IEEE 63rd Electronic Components and Technology Conference 2013
DOI: 10.1109/ectc.2013.6575608
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Transient liquid phase sintered attach for power electronics

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Cited by 25 publications
(9 citation statements)
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“…Plating assisted TLP Plated balls Cu-Sn Sn plated Cu, pressure less [57] Thermal gradient TLP IMC layer Cu-Sn IMC layer [58] Solder paste TLP Paste Cu-Sn Solder paste [59] Sintering assisted TLP Residue Cu-Sn Sn-residue [60] Sintering assisted TLP Activated paste Cu-Sn Formic acid-solder paste [61] The melting point inhibitors such as Ag, Cu, or Ni in Sn do not have high diffusivity in solid base Cu, and it takes a longer time for isothermal solidification. The major Sn-based solder systems include Sn-3.5Ag, Sn-0.7Cu, and Sn-3.0Ag-0.5Cu.…”
Section: Bonding Timementioning
confidence: 99%
“…Plating assisted TLP Plated balls Cu-Sn Sn plated Cu, pressure less [57] Thermal gradient TLP IMC layer Cu-Sn IMC layer [58] Solder paste TLP Paste Cu-Sn Solder paste [59] Sintering assisted TLP Residue Cu-Sn Sn-residue [60] Sintering assisted TLP Activated paste Cu-Sn Formic acid-solder paste [61] The melting point inhibitors such as Ag, Cu, or Ni in Sn do not have high diffusivity in solid base Cu, and it takes a longer time for isothermal solidification. The major Sn-based solder systems include Sn-3.5Ag, Sn-0.7Cu, and Sn-3.0Ag-0.5Cu.…”
Section: Bonding Timementioning
confidence: 99%
“…Liquid phase diffusion bonding reactions in the Sn-Cu-Ni system were examined by McCluskey, Greve, and Moeini with a Sn-3.5Ag LTP in combination with Cu, Ni, or mixture of Cu and Ni powders with Ni substrates as the HTP substrates [67,68,72] . Samples were processed at a peak temperature of 300°C in an inert atmosphere for approximately 30 minutes using 0. as the HTP and up to 600 °C (test setup limit) with Ni HTP particles [73] .…”
Section: Liquid Phase Diffusion Bonding In the Cu-ni-sn Systemmentioning
confidence: 99%
“…[67,68,72] Samples were processed at a peak temperature of 300°C in an inert atmosphere for approximately 30 minutes using 0.2 MPa of applied pressure to reduce void formation. The resulting microstructures for NiSn and (Cu, Ni)-Sn contained few voids; pockets of Sn in cross-sections of the bonds indicated incomplete solidification.…”
Section: Liquid Phase Diffusion Bonding In the Cu-ni-sn Systemmentioning
confidence: 99%