2013
DOI: 10.1016/j.scriptamat.2013.05.001
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Transient-regime grain growth in nanocrystalline yttria-stabilized zirconia annealed without and with a DC electric field

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Cited by 14 publications
(12 citation statements)
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References 22 publications
(39 reference statements)
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“…2 refers to the parameter with applied field, its absence without field. In prior work [4,5,19], it was found that the parameters A, D, and m are relatively independent of E. Rearranging Eq. 2 then gives for a constant temperature…”
Section: The Modelmentioning
confidence: 98%
“…2 refers to the parameter with applied field, its absence without field. In prior work [4,5,19], it was found that the parameters A, D, and m are relatively independent of E. Rearranging Eq. 2 then gives for a constant temperature…”
Section: The Modelmentioning
confidence: 98%
“…The main body of comparative grain growth studies relates to the ionic conducting systems of stabilized zirconia [112][113][114][115][116][117][118]. Densification and grain growth behaviour of porous and dense specimens were investigated under the applied AC and DC fields.…”
Section: Grain Growth Studiesmentioning
confidence: 99%
“…However, the application of 18 V cm -1 DC electric field on similar dense specimens at 1400°C resulted in faster grain growth, i.e. linear grain growth, compared to the normal grain growth (parabolic) in the absence of the field [113]. The authors referred the change in grain growth behaviour to the field effect on the solute drag mechanism in 3Y-TZP.…”
Section: Grain Growth Studiesmentioning
confidence: 99%
“…Recently, different models for rapid field-affected sintering, densification and grain growth of ceramic oxide nanoparticles were proposed. These refer either to the formation of a high density of defects at the surfaces and grain boundaries [1][2][3] and a decrease in the grain boundary energy [4], or to enhanced diffusion through an amorphous layer at the particle surfaces due to surface discharges and possible plasma formation [5][6][7][8][9]. Experimental evidence has been provided for the breakdown of the nonconducting oxide layers at the surfaces of metallic nanoparticles subjected to low voltages, simulating the SPS conditions [9][10][11][12].…”
mentioning
confidence: 99%