2013
DOI: 10.1007/s10909-013-1004-5
|View full text |Cite
|
Sign up to set email alerts
|

Transition-Edge Sensors for Particle Induced X-ray Emission Measurements

Abstract: In this paper we present a new measurement setup, where a transitionedge sensor detector array is used to detect X-rays in particle induced X-ray emission measurements with a 2 MeV proton beam. Transition-edge sensors offer orders of magnitude improvement in energy resolution compared to conventional silicon or germanium detectors, making it possible to recognize spectral lines in materials analysis that have previously been impossible to resolve, and to get chemical information from the elements. Our sensors … Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
24
0

Year Published

2016
2016
2022
2022

Publication Types

Select...
5
1

Relationship

3
3

Authors

Journals

citations
Cited by 22 publications
(24 citation statements)
references
References 13 publications
0
24
0
Order By: Relevance
“…In contrast to Ref. [6], however, the distance between the detector and the samples is reduced from 30 to 15 cm, increasing the collection efficiency by a factor of 4. An Amptek X-123SDD silicon drift detector is used as a reference detector, with measurements performed in air.…”
Section: Experiments a Detector Setupmentioning
confidence: 81%
See 4 more Smart Citations
“…In contrast to Ref. [6], however, the distance between the detector and the samples is reduced from 30 to 15 cm, increasing the collection efficiency by a factor of 4. An Amptek X-123SDD silicon drift detector is used as a reference detector, with measurements performed in air.…”
Section: Experiments a Detector Setupmentioning
confidence: 81%
“…We recently developed a powerful x-ray spectroscopic materials analysis tool [6], which utilizes an array of superconducting transition-edge sensors operated at 0.1 K as the detectors, coupled with an ion-beam (proton) excitation by an accelerator (TES PIXE). Here, we demonstrate the spectroscopic capabilities of the instrument by measuring several complex samples with many elements.…”
Section: Discussionmentioning
confidence: 99%
See 3 more Smart Citations