1990
DOI: 10.1088/0022-3727/23/12/012
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Transition from streamer to Townsend mechanisms in dielectric voids

Abstract: The time dependence of the discharge processes in dielectric bounded voids of 40 mm have been studied under power frequency voltage. Fast oscilloscopic techniques were used to observe the pulse shape of single discharges or clusters of discharges. Synchronous optical registration of discharge images was performed using a highly sensitive video system. At least two distinct discharge types were registered as a function of time. A 'streamerlike' discharge regime is gradually replaced by a more diffuse 'Townsendl… Show more

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Cited by 86 publications
(46 citation statements)
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“…As already reported in the literature, in large disk-shaped voids, transition takes place from streamer mechanism to Townsend mechanism due to a conducting layer formed on the dielectric walls by discharge by-products [7][8][9][10][11]. However, an important point to note is that streamer discharges do not occur in submillimeter cavities, in the absence of the critical length required for formation of a streamer head [1].…”
Section: Introductionmentioning
confidence: 71%
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“…As already reported in the literature, in large disk-shaped voids, transition takes place from streamer mechanism to Townsend mechanism due to a conducting layer formed on the dielectric walls by discharge by-products [7][8][9][10][11]. However, an important point to note is that streamer discharges do not occur in submillimeter cavities, in the absence of the critical length required for formation of a streamer head [1].…”
Section: Introductionmentioning
confidence: 71%
“…For a relatively short anode-cathode gap distance, the effect of the micro-cavity dimensions on the discharge characteristics, from experimental as well as theoretical findings, is evident [7,[30][31][32][33][34][35][36][37][38][39][40][41]. In this paper, the length of the micro-cavity is varied from 50 to 600 lm, while the applied electric field across micro-cavity is held constant at E = 10 6 V/m.…”
Section: Micro-cavity Lengthmentioning
confidence: 88%
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“…electrical field, spacecharge distribution [1][2][3], partial discharge which causes material degradation, the increase of channel conductance [4][5][6], change of gas pressure in the channels [4,[7][8][9][10] and so on.…”
Section: Introductionmentioning
confidence: 99%