We report angle-resolved photoemission spectroscopic measurements of the evolution of the thickness-dependent electronic band structure of the heavy-atom two-dimensional layered, dichalcogenide, tungsten-diselenide (WSe 2 ). Our data, taken on mechanically exfoliated WSe 2 singlecrystals, provide direct evidence for shifting of the valence-band maximum from Γ (multilayer WSe 2 ), to K , (single-layer WSe 2 ). Further, our measurements also set a lower bound on the energy of the direct band-gap and provide direct measurement of the hole effective mass.Single layers of two-dimensional metal dichalcogenides (TMDCs) such as MoS 2 , have emerged as a new class of non-centrosymmetric direct-bandgap materials with potential photonic and spintronic applications.[ [4] . In addition, ML WSe 2 has been demonstrated to be the first TMDC material possessing ambipolar, i.e., both p-type and n-type conducting behavior, [4][12] thus making it possible to design additional electronic functionality, such as p-n junctions or complementary logic circuits.Despite these intriguing characteristics, measurements of ML WSe 2 have generally been limited to probing of optical and transport properties. [4][5] [6] In this paper, we report thickness-dependent measurements of the surface and electronic structure of exfoliated WSe 2, using low-energy electron microscopy (LEEM), diffraction (LEED), and micrometer-scale angle-resolved photoemission spectroscopy (µ-ARPES) of samples supported on a native-oxide terminated silicon substrate. Our experimental results provide direct evidence for a predicted valence-band maximum (VBM) symmetrypoint change, which leads to an indirect-to-direct bandgap transition. Because TMDCs have a large carrier effective mass and reduced screening in two dimensions, electron-hole interactions are much stronger than in conventional semiconductors. [13][14] [15] Our results allow us to obtain a direct measurement of the hole effective mass. Finally, our measurements allow us to directly infer a lower bound on the energy of the direct band gap.
2Our measurements were performed using the spectroscopic photoemission and low-energy electron microscope (SPE-LEEM) system at the National Synchrotron Light Source (NSLS) beamline U5UA.[16] [17] The spectrometer energy resolution of this instrument was set to 100 meV at 33 eV incident photon energy with a beam spot size of 1 μm in diameter. The momentum resolution is ~0.02 Å -1. Exfoliated WSe 2 samples were transferred to a native-oxide covered Si substrate; prior to measurements, these samples were annealed at 350 o C for ~12 hours under UHV conditions. The layer number of the sample is determined by Raman and photoluminescence spectroscopy.[18] [19] Additional experimental details can be found in the Supplemental Materials section.Sample quality and crystal orientation were examined using both LEEM and µ-LEED (Fig. 1). Diffraction patterns (at a primary electron energy of 48eV) of exfoliated WSe 2 flakes of 1-3ML and bulk are shown in Fig. 2a-d, respectively, and cl...