2006
DOI: 10.1080/14786430600750038
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Transmission electron microscopyin situinvestigation of dislocation behaviour in semiconductors and the influence of electronic excitation

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Cited by 4 publications
(3 citation statements)
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“…When dealing with III-V-V materials the exact composition may influence dynamics, and to illustrate how much this can affect dynamics it was seen that defect velocity in GaP was 100 times that in GaAs [173]. Interaction of an electron beam is also known to influence defect dynamics [174][175][176].…”
Section: Mechanisms Of Defect Motionmentioning
confidence: 99%
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“…When dealing with III-V-V materials the exact composition may influence dynamics, and to illustrate how much this can affect dynamics it was seen that defect velocity in GaP was 100 times that in GaAs [173]. Interaction of an electron beam is also known to influence defect dynamics [174][175][176].…”
Section: Mechanisms Of Defect Motionmentioning
confidence: 99%
“…In addition to uncertainties about NW shape there are several complicating factors that make quantitative study difficult. Factors include the different core structure of up-and down-steps; the variation of stacking fault energy with temperature [238]; pinning by impurity segregation [166,170,171]; varying composition in a core-shell structure; changes to the NW surface during heating [172]; and the effect of the electron beam [174][175][176]. In the absence of this information, it can only be said that these measurements give an upper bound to the activation energy of approximately 2 eV.…”
Section: Movement Stopped By Interactionsmentioning
confidence: 99%
“…In addition to uncertainties about NW shape there are a formidable number of complicating factors that make quantitative study difficult. These include the different core structure of up- and down-steps; the variation of stacking fault energy with temperature; pinning by impurity segregation; ,, varying composition in a core–shell structure; changes to the NW surface during heating; and indeed the effect of the electron beam. In the absence of this information, one can only say that these measurements only give an upper bound to the activation energy of ∼2 eV.…”
mentioning
confidence: 99%