2004
DOI: 10.1111/j.0022-2720.2004.01352.x
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Transmission electron microscopy of fluorapatite–gelatine composite particles prepared using focused ion beam milling

Abstract: SummaryIn this paper, synthetic fluorapatite-gelatine composite particles are prepared for transmission electron microscopy (TEM) studies using two methods based on focused ion beam (FIB) milling. TEM studies on the FIB-prepared specimens are compared with TEM observations on samples prepared using an ultramicrotome. The results show that ultramicrotome slicing causes significant cracking of the apatite, whereas the ion beam can be used to make high-quality, crack-free specimens with no apparent ion beam-induc… Show more

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Cited by 22 publications
(15 citation statements)
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“…80 GPa [44]) assessed under bending. The possibility of degradation in the HAP crystallites owing to FIB treatment was elaborated using TEM [51,52], where HAP is reported to be structurally resistant to FIB-induced damage. Moreover, Chan et al [49] revealed no significant difference in the elastic modulus and hardness of enamel before and after FIB preparation, which would not be expected in the presence of protein degradation [53].…”
Section: (B) Hierarchical Level 1: Multiple Crystallites (I) Structurmentioning
confidence: 99%
“…80 GPa [44]) assessed under bending. The possibility of degradation in the HAP crystallites owing to FIB treatment was elaborated using TEM [51,52], where HAP is reported to be structurally resistant to FIB-induced damage. Moreover, Chan et al [49] revealed no significant difference in the elastic modulus and hardness of enamel before and after FIB preparation, which would not be expected in the presence of protein degradation [53].…”
Section: (B) Hierarchical Level 1: Multiple Crystallites (I) Structurmentioning
confidence: 99%
“…For example, Cu is prone to extensive FIB damage, 31 as shown in the TEM image in Figure 7, but Al is not and even provides reasonable-quality highresolution TEM samples. 32 Tooth enamel (hydroxyapatite) is resistant to FIBinduced damage, 33 but other apatite crystals that decompose at lower temperatures amorphize easily. Several additional and unusual types of damage have been observed in FIB-milled samples.…”
Section: Ion Beam Damagementioning
confidence: 99%
“…[6] TEM reveals nanometer resolution of the ultrastructure and allows detailed analysis of the cell-to-material interface however, TEM is limited by its time consuming sample preparation that involves production of ultra thin sections which are very difficult to obtain when hard structures such as bone or metal implants need to be sectioned adjacent to softer materials. [19] In addition, serial sections at different sites of the sample are necessary to find the region of interest. Another limitation for TEM consists in the fact that cell organelles can be investigated in detail however it is often not possible to distinguish between different substructures of complex cells that represent different functional and morphological entities.…”
mentioning
confidence: 99%