Microscopy Methods in Nanomaterials Characterization 2017
DOI: 10.1016/b978-0-323-46141-2.00004-3
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Transmission Electron Microscopy of Nanostructures

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Cited by 10 publications
(9 citation statements)
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“…Note that at room temperature, the emission wavelength 5.62 µm is greater than the calculated value of 5.4 µm by 0.2 µm. It is explained by a small smearing of interfaces in the nanoheterostructure, which agrees with data from [11], where roughness of interfaces of QCL grown by the MOVPE method was studied by transmission electron microscopy. Such shift effect to the long-wavelength side was also observed in [12], where QCL was also created by the MOVPE method and the corresponding long-wavelength shift reached even 0.5-1 µm.…”
Section: Measurement Results and Discussionsupporting
confidence: 87%
“…Note that at room temperature, the emission wavelength 5.62 µm is greater than the calculated value of 5.4 µm by 0.2 µm. It is explained by a small smearing of interfaces in the nanoheterostructure, which agrees with data from [11], where roughness of interfaces of QCL grown by the MOVPE method was studied by transmission electron microscopy. Such shift effect to the long-wavelength side was also observed in [12], where QCL was also created by the MOVPE method and the corresponding long-wavelength shift reached even 0.5-1 µm.…”
Section: Measurement Results and Discussionsupporting
confidence: 87%
“…In principle, TEM can identify the position of lattice planes in a crystalline solid and can produce the lattice diffraction pattern as well. Additional features are available in TEM: an electron beam is swept in a raster over the sample producing a scanning transmission electron microscopy (STEM) image; Energy dispersive X-ray spectroscopy (EDX) can be used to estimate the composition of the sample [ 51 ]. The cross-sectional variant of the TEM (X-TEM) is capable of imaging embedded QDs to provide both structural and compositional insight.…”
Section: Characterization Techniquesmentioning
confidence: 99%
“…TEM provides information about morphology, crystallographic degree, crystallographic planes, nanomaterials defects, etc., based on analysis by diffraction, spectroscopic methods, and imaging. High-resolution scanning transmission electron microscopy (HR-STEM) may resolve at the atomic level, depending on the medium that supports the particles [ 81 ]. Atomic force microscopy (AFM) operates through a scanning probe and gives information about the topography, size and shape of the nanomaterials and biomolecules, as well as adhesion and other interactions in the nanobioconjugates [ 1 ].…”
Section: Characterization Of Nanobioconjugatesmentioning
confidence: 99%