Transmitted wavefront metrology of hemispheric domes using scanning low-coherence dual-interferometry (SLCDI)

Diehl, Damon W.; Cotton, Christopher T.; Ditchman, Christopher J.; Statt, Bryan D.

doi:10.1117/12.718737

Cited by 2 publications

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“…We have previously demonstrated that an accurate 3D model of an optical element can be built by scanning the OptiGauge probe across an object. 16,17 To address the specific issues related to measuring freeform surfaces, we have developed a new probe for the OptiGauge that incorporates a reference surface into the tip of the probe and simultaneously projects four beams in a square pattern. By simultaneously measuring four points, the Quad-Probe can determine the position and orientation of the tangent plane at each sample position.…”

Section: Introductionmentioning

confidence: 99%

Low-coherence surface metrology using a multiple-beam optical probe

Diehl¹,

Ditchman²,

Cotton³

2009

Window and Dome Technologies and Materials XI

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Despite increasing demand for freeform optical elements, at present there are no commercial systems to measure such components. In previously published research we demonstrated that a scanning low-coherence dualwavelength interferometer can accurately measure the transmitted wavefront of hemispheric dome optics by mapping the optical thickness of the dome as a function of probe probe position. To address the issue of more generalized freeform surfaces, we have developed a new probe for the interferometer. This probe incorporates a reference surface and simultaneously projects four beams. This allows the instrument to measure both the position and orientation of the surface with respect to the probe as the probe is scanned over the object. Both the interior and exterior surfaces can be measured simultaneously. Furthermore, by overlapping the measurement regions, the redundant data can be used to minimize some forms of measurement error.

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Section: Introductionmentioning

confidence: 99%

Low-coherence surface metrology using a multiple-beam optical probe

Diehl¹,

Ditchman²,

Cotton³

2009

Window and Dome Technologies and Materials XI

Self Cite

View full text Add to dashboard Cite

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Angular scan optical coherence tomography imaging and metrology of spherical gradient refractive index preforms

et al. 2015

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The fabrication of high-performance spherical gradient refractive index (S-GRIN) optics requires nondestructive metrology techniques to inspect the samples. We have developed an angular-scan, swept-source-based, Fourier-domain optical coherence tomography (OCT) system centered at 1318 nm with 5 mm imaging depth capable of 180° polar scan and 360° azimuthal scan to investigate polymeric S-GRIN preforms. We demonstrate a method that enables simultaneous mapping of the group optical thickness, physical thickness, the radially-averaged group refractive index, and the transmitted wavefront of the S-GRIN preforms. The angular scan OCT imaging and metrology enables direct visualization, molding uniformity characterization, and optical property evaluations of the preforms. The results on two generations of S-GRIN preforms are discussed that showcase the evolution of the manufacturing process in response to the OCT metrology feedback.

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Transmitted wavefront metrology of hemispheric domes using scanning low-coherence dual-interferometry (SLCDI)

Cited by 2 publications

References 0 publications

Low-coherence surface metrology using a multiple-beam optical probe

Low-coherence surface metrology using a multiple-beam optical probe

Angular scan optical coherence tomography imaging and metrology of spherical gradient refractive index preforms

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