Transparent TiO2/Cu/TiO2 Multilayer for Electrothermal Application

Abstract

Highly transparent indium-free multilayers of TiO2/Cu/TiO2 were obtained by means of annealing. The effects of Cu thickness and annealing temperature on the electrical and optical properties were investigated. The critical thickness of Cu mid-layer with optimal electrical and optical properties was 10 nm, with the figure of merit reaching as high as 5 × 10−3 Ω−1. Partial crystallization of the TiO2 layer enhanced the electrical and optical properties upon annealing. Electrothermal experiments showed that temperatures of more than 100 °C can be reached at a heating rate of 2 °C/s without any damage to the multilayers. The experimental results indicate that reliable transparent TiO2/Cu/TiO2 multilayers can be used for electrothermal application.

Maintaining the localized surface plasmon resonance of copper nanoparticles by defective TiO2 thin films

“…It was reported Cu atoms could decrease the crystallization of TiO 2 to temperatures of 300 °C, [29] even to 210 °C. [30] Therefore, the crystallization temperature of 1nmTiO 2 should be further decreased after 1nmCuNPs was deposited on its surface.…”