2013
DOI: 10.1063/1.4817657
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Transport phenomena in intrinsic semiconductors and insulators at high current densities: Suppression of the broken neutrality drift

Abstract: Articles you may be interested inProfiling of the injected charge drift current transients by cross-sectional scanning technique Defective states induced in CdTe and CdZnTe detectors by high and low energy neutron irradiation

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