Luminescence - An Outlook on the Phenomena and Their Applications 2016
DOI: 10.5772/65306
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Trap Level Measurements in Wide Band Gap Materials by Thermoluminescence

Abstract: The electrical and optical properties of wide band gap materials are greatly affected by the presence of defects in the band gap. Identification and characterization of these defects that act as electron and hole traps are essential to understand charge carrier and exciton dynamics and ultimately control the electrical and optical properties of dielectrics and semiconductors. In this chapter, we will demonstrate how thermoluminescence (TL) spectroscopy can be used to characterize traps and measure their energy… Show more

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Cited by 4 publications
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“…Usually, these states are located at the center of the forbidden band (see Figure S2). Moreover, the possibility of obtaining localized states that do not participate in the recombination process also exists, which are identified as traps, either for electrons or holes, and tend to be strictly related to thermal stimulation . These traps are characterized by their effective capture cross-section (σ n ; σ h ).…”
Section: Resultsmentioning
confidence: 99%
“…Usually, these states are located at the center of the forbidden band (see Figure S2). Moreover, the possibility of obtaining localized states that do not participate in the recombination process also exists, which are identified as traps, either for electrons or holes, and tend to be strictly related to thermal stimulation . These traps are characterized by their effective capture cross-section (σ n ; σ h ).…”
Section: Resultsmentioning
confidence: 99%
“…[30] Thermoluminescence (TL) is a perfect tool for dosimetry and dating applications (e.g., [31,32] ); it is also a great tool for the detection of traps and measuring their energy levels. [33,34] Other methods based on thermally stimulated processes such as thermally stimulated conductivity (TSC) and thermally stimulated polarization and depolarization current can be also used to measure the trap levels. [35,36] TL or TSL has been widely applied for measuring deep and relatively shallow traps in optical and photonic materials [37,38] and has been quite useful for optical studies of single crystals, films, phosphors, and transparent ceramics for lasers, scintillators, and solid-state lighting applications and more.…”
Section: Introductionmentioning
confidence: 99%
“…Figure 4(c) illustrates the extraction of thin-film E a .Through the linear fitting of the Arrhenius equation,26) …”
mentioning
confidence: 99%