2011
DOI: 10.1021/nl201434t
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Triaxial AFM Probes for Noncontact Trapping and Manipulation

Abstract: We show that a triaxial atomic force microscopy probe creates a noncontact trap for a single particle in a fluid via negative dielectrophoresis. A zero in the electric field profile traps the particle above the probe surface, avoiding adhesion, and the repulsive region surrounding the zero pushes other particles away, preventing clustering. Triaxial probes are promising for three-dimensional assembly and for selective imaging of a particular property of a sample using interchangeable functionalized particles.

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Cited by 26 publications
(31 citation statements)
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“…139 Analogously, dielectrophoresis refers to the force generated on a neutral particle when it is in an AC electric field: the electric field polarizes the particle, which in the non-uniform field results in a non-zero Coulomb force acting on the particle. Although two electrodes are usually required for dielectrophoresis 140 , the use of a triaxial probe to generate a dielectrophoresis field that acts as a non-contact trap for dielectric nanoparticles has been recently demonstrated 141,142 ( see FIG. 14).…”
Section: Electrokinetic Nanomanipulationmentioning
confidence: 99%
See 1 more Smart Citation
“…139 Analogously, dielectrophoresis refers to the force generated on a neutral particle when it is in an AC electric field: the electric field polarizes the particle, which in the non-uniform field results in a non-zero Coulomb force acting on the particle. Although two electrodes are usually required for dielectrophoresis 140 , the use of a triaxial probe to generate a dielectrophoresis field that acts as a non-contact trap for dielectric nanoparticles has been recently demonstrated 141,142 ( see FIG. 14).…”
Section: Electrokinetic Nanomanipulationmentioning
confidence: 99%
“…This method is proposed to work for particles as small as 5 nm 141 and has been verified for the isolation of 100 nm polystyrene beads. 142 The non-contact manipulation of nanoparticles in 3D can thus be achieved, with the probe moving the particle through the solution and releasing it on command. However, the strength of the trap limits the positioning accuracy of the particles in the solution, with the polystyrene beads having standard deviations of 133 nm and 204 nm in the x and y axes from the intended location.…”
Section: Electrokinetic Nanomanipulationmentioning
confidence: 99%
“…Burgeoning methods of additive nanomanufacturing offer a potential solution to this problem, by enabling the top-down integration of existing devices with nanomaterials [1][2][3][4][5][6] , whose properties have demonstrable applications in novel areas of biosensing 4 , single-electron transport 5 , quantum phenomena 6 , and more. These materials can be made to self-assemble into desired configurations via many driving forces, from electrophoresis [7][8][9][10] , DNA-linkages 11,12 and geometrical interactions [13][14][15] . Controlling when and where such self-assembly occurs requires lithography, however, which to integrate with modern device designs must meet sub-100 nm resolution as standard.…”
Section: Introductionmentioning
confidence: 99%
“…Another research study of particular interest was performed by Brown et al [63]. In this study, Brown et al created a tri-axial probe to be used for DEP studies.…”
Section: Dielectrophoresismentioning
confidence: 99%
“…FIGURE 2 -Tri-Axial AFM Probe [63] These experiments were done to illustrate particle trapping by nDEP [63]. The purpose of the study was to determine if "pick and place" nano-assembly was possible using DEP.…”
Section: Dielectrophoresismentioning
confidence: 99%