2011
DOI: 10.1109/tdmr.2011.2165072
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Triggering of Transient Latch-up by System-Level ESD

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Cited by 10 publications
(1 citation statement)
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“…The influence of ambient temperature obtained here can be verified with Ref. [15], which concludes the latch-up triggering voltage decreases with temperature increasing from 300 to 400 K. The comparison of the two results is shown in Fig. 7 by a normalization method, with the triggering voltage at 300 K is used as a reference.…”
Section: Hpm Susceptibility Trend As a Function Of Ambient Temperaturesupporting
confidence: 81%
“…The influence of ambient temperature obtained here can be verified with Ref. [15], which concludes the latch-up triggering voltage decreases with temperature increasing from 300 to 400 K. The comparison of the two results is shown in Fig. 7 by a normalization method, with the triggering voltage at 300 K is used as a reference.…”
Section: Hpm Susceptibility Trend As a Function Of Ambient Temperaturesupporting
confidence: 81%