Tritium and helium analyses in thin films by enhanced proton backscattering

Fu, Tao; An, Zhu; Zhu, J. J.; Liu, Man-Tian; Mao, Li

doi:10.1088/1674-1137/38/8/088203

Chinese Phys. C

2014

DOI: 10.1088/1674-1137/38/8/088203

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Tritium and helium analyses in thin films by enhanced proton backscattering

Tao Fu¹,

Zhu An²,

J. J. Zhu³

et al.

Abstract: In order to perform quantitative tritium and helium analysis in thin film sample by using enhanced proton backscattering (EPBS), EPBS spectra for several samples consisting of non-RBS light elements (i.e., T, 4 He, 12 C, 16 O, nat Si), medium and heavy elements have been measured and

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Cited by 3 publications

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Tritium analysis in zirconium film with BIXS and EBS: Generality test of Al thin film as the β-ray stopping layer in BIXS

Liu

Ding

et al. 2021

Fusion Engineering and Design

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Tritium and helium analyses in thin films by enhanced proton backscattering

Abstract: In order to perform quantitative tritium and helium analysis in thin film sample by using enhanced proton backscattering (EPBS), EPBS spectra for several samples consisting of non-RBS light elements (i.e., T, 4 He, 12 C, 16 O, nat Si), medium and heavy elements have been measured and

Cited by 3 publications

References 23 publications

Tritium analysis in zirconium film with BIXS and EBS: Generality test of Al thin film as the β-ray stopping layer in BIXS

Tritium analysis in zirconium film with BIXS and EBS: Generality test of Al thin film as the β-ray stopping layer in BIXS

An experimental system of wide-range two dimensional Rutherford backscattering analysis in vacuum chamber

BIXS for tritium analysis with Ar gas and Al thin film as β-ray stopping layers and comparison with EBS

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