Troubleshooting Analog Circuits

Pease, Robert A.

doi:10.1016/b978-0-7506-9166-6.50042-8

Cited by 24 publications

(6 citation statements)

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“…The standard method for measuring resistance in modern instruments is the ratiometric method, [14] and [15]. While regular absolute (direct) measurements are simpler (such as U/I method), the ratiometric method, on the other hand, performs two (or an even number) of measurements, and the desired value can be calculated based on the ratio of those measurements.…”

Section: Fig 3 the Wheatstone Bridgementioning

confidence: 99%

“…The finite resistance of the test leads connecting shunt to the multimeter [15] introduces an additional error in measurement. This resistance can be of the same magnitude as shunt resistance, but also up to ten times higher, if low-quality test leads are used.…”

Section: Fig 3 the Wheatstone Bridgementioning

confidence: 99%

“…Also, it is simple enough to be handled by the untrained technical personnel in the production, making it the best possible solution for the given problem. During the design process of Com-mOhm, various design inputs from [14], [15], [22], [23], [24], [25] and [26] were used.…”

Section: Description Of the Optimal Solutionmentioning

confidence: 99%

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Composite milliohm-meter for resistance measurement of precision current shunts in industrial environment

2019

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A composite milliohm-meter (Com-mOhm), based on standard four-wire Kelvin resistance measurement method, was developed for measurements of precision current shunts used in an industrial environment. The system is comprised of a precision, temperature compensated, low drift, high stability 100 mA current source and a 4 ½ digit commercial multimeter. Due to the set of specific demands and conditions concerning the industrial applications of precision current shunts, standard measurement equipment and methods could not be implemented. The composite resistor standard was used for temperature stabilization of the precision current source based on precision voltage reference REF102. The measurement precision of ±0.1 milliohms is observed during measurement of 20 milliohm current shunts.

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Section: Fig 3 the Wheatstone Bridgementioning

confidence: 99%

Section: Fig 3 the Wheatstone Bridgementioning

confidence: 99%

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Composite milliohm-meter for resistance measurement of precision current shunts in industrial environment

2019

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“…The configuration amplifies the nonlinearities of the opamp by a gain of 400 while only providing a small gain to the input noise and mismatches. The test configuration was originally proposed to measure CMRR in an opamp [28]. By stimulating the terminals and with optimal signature tests, both the common mode as well as differential behavior of the opamp can be tested.…”

Section: A Analog Test Optimization Example: Lm741mentioning

confidence: 99%

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

Voorakaranam¹,

Akbay

Bhattacharya

et al. 2007

IEEE Trans. Circuits Syst. I

103

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There are mainly two factors responsible for rapidly escalating production test costs of today's RF and high-speed analog circuits: 1) the high cost of high-speed and RF automatic test equipments and 2) long test times required by elaborate performance tests. In this paper, we propose a low-cost signature test methodology for accelerated production testing of analog and RF integrated circuits. As opposed to prior work, the key contribution of this paper is a new test generation algorithm that directly tracks the ability of input test waveforms to predict the test specification values from the observed test response, even in the presence of measurement noise. The response of the device-under-test (DUT) is used as a "signature" from which all of the performance specifications are predicted. The applied test stimulus is optimized in such a way that the error between the measured DUT performances and the predicted DUT performances is minimized. While existing low-cost test approaches have only been applied to lowand medium-frequency analog circuits, the proposed methodology extends low-cost signature testing to RF integrated circuits by incorporating modulation of a baseband test stimulus and subsequent demodulation of the obtained response to obtain the DUT signature. The proposed low-cost solution can be easily built into a load board that can be interfaced to an inexpensive tester.

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“…If both inputs will go beyond the specified input range, the output will typically be driven to one of the power supply rails. (for more details, see [13] and [25]).…”

Section: Lm 555 (Monostable Configuration)mentioning

confidence: 99%

Adding liveness detection to the hand geometry scanner

Crihalmeanu¹

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Troubleshooting Analog Circuits

Cited by 24 publications

References 0 publications

Composite milliohm-meter for resistance measurement of precision current shunts in industrial environment

Composite milliohm-meter for resistance measurement of precision current shunts in industrial environment

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

Adding liveness detection to the hand geometry scanner

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