2007
DOI: 10.1016/j.jlumin.2006.10.002
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Tunable light emission and decaying process of photoluminescence from a nanostructured Si-in-SiNx film

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Cited by 4 publications
(4 citation statements)
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“…5(c)], we see that the most effective excitation occurs at ∼375 nm, as confirmed by the PL excitation spectrum monitored at an emission wavelength of 455 nm (not shown here, see Ref. [11]). Remarkably, a plateau of emission integral intensity appears within 340 to 410 nm.…”
supporting
confidence: 78%
“…5(c)], we see that the most effective excitation occurs at ∼375 nm, as confirmed by the PL excitation spectrum monitored at an emission wavelength of 455 nm (not shown here, see Ref. [11]). Remarkably, a plateau of emission integral intensity appears within 340 to 410 nm.…”
supporting
confidence: 78%
“…As demonstrated in our early publications [10][11][12][13][14]19], the average size for silicon particles achieved in SiC is less than that in SiN x prepared under similar growth conditions. Yet the quantum confinement PL emission may have a shorter wavelength in SiN x than in SiC since the former provides a stronger confinement to the silicon nanoparticles.…”
Section: Resultsmentioning
confidence: 74%
“…This clearly shows that PL properties for a multilayered structure of sufficiently narrower individual Si-in-SiC layers are evidently different from that of the simple Si-in-SiC film in which the amorphous SiC matrix provides a homogeneous potential field for the confined particles. Besides, it also facilitates an enhanced light emission in such a multilayered, single-matrix system [14,19]. The effect of the multilayered structure will be more pronounced in the SiC/SiN x structure where the two compounds have largely differing bandgaps, especially when the layer thickness is sufficiently small that it can be taken as a quantum well.…”
Section: Resultsmentioning
confidence: 99%
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