“…The grain metric is important for the introduction of grain boundaries and the tunability of the thin films functional properties. For example, those grain boundaries can bring extrinsic properties to the thin films such as in LSMO, which are not present for single crystal films (see figure 7) [10]. As we can see, at low temperature, single crystal films present a very small MR, whereas, the polycrystalline substrates induce new effect on the LSMO films with low field Magnetoresistance (LFMR), and an important MR. More importantly, those effects can be tuned by their density in the films as seen on figure 7, where this MR tends to increase with the decrease of the grain size and therefore the importance of the grain metric control of the polycrystalline substrates.…”